Analysis and validation of IEC 61131-3 applications using a MDE approach
- Marcos, M.
- Estévez, E.
- Iriondo, N.
- Orive, D.
Konferenzberichte:
Proceedings of the 15th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2010
ISBN: 9781424468508
Datum der Publikation: 2010
Art: Konferenz-Beitrag