Stress-induced phase transformations studied by in-situ transmission electron microscopy
- Nó, M.L.
- Ibarra, A.
- Caillard, D.
- San Juan, J.
Konferenzberichte:
Journal of Physics: Conference Series
ISSN: 1742-6596, 1742-6588
Datum der Publikation: 2010
Ausgabe: 240
Art: Konferenz-Beitrag