Quantitative analysis of stress-induced martensites by in situ transmission electron microscopy superelastic tests in Cu-Al-Ni shape memory alloys
- Nó, M.L.
- Ibarra, A.
- Caillard, D.
- San Juan, J.
ISSN: 1359-6454
Année de publication: 2010
Volumen: 58
Número: 18
Pages: 6181-6193
Type: Article