Thermal creation of defects in GaTe

  1. Zubiaga, A.
  2. García, J.-A.
  3. Plazaola, F.
  4. Muñoz-Sanjosé, V.
  5. Martínez-TomáS, C.
Revue:
Japanese Journal of Applied Physics

ISSN: 0021-4922,  1347-4065

Année de publication: 2008

Volumen: 47

Número: 12

Pages: 8719-8722

Type: Article

DOI: 10.1143/JJAP.47.8719 GOOGLE SCHOLAR
La source de données: Scopus