Comparative analysis of GaN HEMT vs. Si CoolMOS for a high-frequency MMC topology
- Avila, A.
- Garcia-Bediaga, A.
- Oñederra, O.
- Rujas, A.
- Rodriguez, A.
Konferenzberichte:
2017 19th European Conference on Power Electronics and Applications, EPE 2017 ECCE Europe
ISBN: 9789075815276
Datum der Publikation: 2017
Ausgabe: 2017-January
Art: Konferenz-Beitrag
