Magnetization depth dependence in exchange biased thin films
- Morales, R.
- Li, Z.-P.
- Petracic, O.
- Batlle, X.
- Schuller, I.K.
- Olamit, J.
- Liu, K.
Revue:
Applied Physics Letters
ISSN: 0003-6951
Année de publication: 2006
Volumen: 89
Número: 7
Type: Article